Test CZ-Si Wafer, Size: 4”, Orientation: (100), Phosphor Doped, Resistivity: 1-30 (ohm.cm), 1-Side Polished, Thickness: 525 ± 20 μm

(No reviews yet) Write a Review
SKU:
NG08SW0234
Contact us on sales@nanografi.com
Frequently bought together:

Description

1 piece/39
5 pieces/160                         
25 pieces/700                         
 
Please contact us for quotes on larger quantities !!! 

Test CZ-Si Wafer

Size: 4”, Orientation: (100), Phosphor Doped, 1-Side Polished

Technical Properties:  

Quality

Test

Materials

CZ-Si

Size (inch)

4”

Orientation

(100)

Coating

 

Thickness (μm)

525 ± 20

Doping

Phosphor

Resistivity (ohm.cm)

1-30

Polished

One Side

Dummy is a grade of wafers, which is also referred as “test wafer” a grade lower than prime.

Dummy CZ Si wafers are often doped with arsenic.

Test grade wafers are high quality but have less stringent properties than prime grade wafers, usually failing for one or more of the Semiconductor Equipment and Materials International (SEMI) standards. Test grade wafers are often used in applications that require a large quantity of wafers for equipment and fabrication testing.

Even if you are doing very high end R&D work it is much more cost effective to develop a process using test wafers and then do the final checks using Prime or Epi-Prime wafers.

View AllClose